Peter Wobrauschek, Peter Kregsamer, Christina Streli, 's Advances in X-Ray Analysis: Volume 34 PDF

By Peter Wobrauschek, Peter Kregsamer, Christina Streli, Hannes Aiginger (auth.), Charles S. Barrett, John V. Gilfrich, I. C. Noyan, Ting C. Huang, Paul K. Predecki (eds.)

ISBN-10: 1461366674

ISBN-13: 9781461366676

ISBN-10: 1461537444

ISBN-13: 9781461537441

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Additional resources for Advances in X-Ray Analysis: Volume 34

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Just below the critical angle (fig. 9a, dotted), the intensity at the surface is large and there is an evanescent wave in the cobalt layer. surface decreases and that inside the layer increases. At the first minimum in the reflectivity (fig. 9a, full line), there is a standing wave of exactly one period in the layer, with the antinode halfway the layer. So on the average, the X"ray intensity in the layer is large, resulting in a maximum in the XRF signal from the elements in that layer.

Gohshi, Grazing incidence X-ray fluorescence analysis, Nucl. Instr. and Methods A246:736 (1986) 9. Komiya: Analysis of contamination layer of InP Process by synchrotron radiation-excited X-ray fluorescence, Jpn. J. Appl. Phys. 27:L1825 (1988) 10. Gohshi, Near-surface analysis of semiconductor using grazing incidence X-ray fluorescence, in: "Adv. , Plenum Press, New York (1988) 11. Gilles, Grazing incidence X-ray fluorescence, Coll. Phys. C7:85 (1989) 12. Patel, X-ray evanescent-wave absorption and emission, Phys.

Spectrum of a standard oil sample with 30 ppm of each element measured on a horizontal positioned sample reflector. 19 ppm. transformation) seems to be problematic due to the inherent rapid changes in the angular behaviour. The availability of multi-layer monochromator crystals, offering high reflectivity up to 90% for the Bragg reflection and thus purely monoenergetic photons for the sample excitation, has lead to a drastic decrease of the background over the entire spectral range. Excitation in total reflection geometry using multi-layer crystals in the primary beam path has been presented by H.

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Advances in X-Ray Analysis: Volume 34 by Peter Wobrauschek, Peter Kregsamer, Christina Streli, Hannes Aiginger (auth.), Charles S. Barrett, John V. Gilfrich, I. C. Noyan, Ting C. Huang, Paul K. Predecki (eds.)

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